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Chemical modification for nanolithography using scanning tunneling microscopy

机译:Chemical modification for nanolithography using scanning tunneling microscopy

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摘要

The key processes needed to push scanning tunneling microscopy (STM) nanolithography (surface modification by STM) into the realm of ordinary semiconductor processes (electron-beam and photolithography) are examined. Complicated nanofeatures are successfully fabricated on an inorganic resist (Ag-Se film), implying the potential possibility of transcription of nanopatterns on a wide variety of substrates. The advantages and disadvantages of two tip-scanning modes (vector scan and raster scan) for writing complicated nanopatterns are described. A scanning tunneling spectroscopy (STS) study clarifies chemical composition of the fabricated nanostructures, which is important for precise pattern transcription.

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  • 来源
    《nanotechnology》 |1992年第4期|161-163|共页
  • 作者

    Y Utsugi;

  • 作者单位

    NTT Labs., Atsugi, Japan;

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  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
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