X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

Kevin L. Baker

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X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

机译：X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

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摘要

We present the design and simulations of the expected performance of a novel 2-D x-ray shearing interferometer. This interferometer uses crossed phase gratings in a single plane, and is capable of operation over a wide range of energies extending from several hundred electron volts to tens of kiloelectron volts by varying the grating material and thickness. This interferometer is insensitive to vibrations and, unlike Moire deflectometers implemented in the hard x-ray regime, recovers the full 2-D phase profile of the x-ray beam rather than the gradient in only one dimension.

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来源
《Optical Engineering》 |2009年第8期|086501-1-086501-5|共5页
作者
Kevin L. Baker;
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作者单位

Lawrence Livermore National Laboratory, 7000 East Avenue L-210, Livermore, California 94550;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类计量学;
关键词
shearing interferometer; x-ray; phase grating; wavefront gradient;

X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

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