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首页> 外文期刊>Optics Letters >Laser-induced birefringence measurements by quantitative polarized-phase microscopy
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Laser-induced birefringence measurements by quantitative polarized-phase microscopy

机译：通过定量偏振相位显微镜进行激光诱导双折射测量

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A technique that provides quantitative and spatially resolved retardance measurement is studied for application to laser-induced modification in transparent materials. The method is based on the measurement of optical path differences between two wavefronts carrying different polarizations, measured by a wavefront sensor placed in the image plane of a microscope. We have applied the technique to the investigation of stress distribution induced by CO2 laser processing of fused silica samples. By comparing experiments to the results of thermomechanical simulations we demonstrate quantitative agreement between measurements and simulations of optical retardance. The technique provides an efficient and simple way to measure retardance of less than 1 nm with a diffraction-limited spatial resolution in transparent samples, and coupled to thermomechanical simulations it gives access to birefringence distribution in the sample. (C) 2017 Optical Society of America
机译：研究了一种提供定量和空间分辨延迟测量的技术，用于透明材料的激光诱导改性。该方法基于测量具有不同偏振的两个波前之间的光程差，通过放置在显微镜图像平面中的波前传感器进行测量。我们已将该技术应用于研究熔融石英样品的CO2激光加工引起的应力分布。通过将实验与热机械模拟结果进行比较，我们证明了光学延迟的测量和模拟之间的定量一致性。该技术提供了一种高效而简单的方法，可以在透明样品中以衍射极限空间分辨率测量小于 1 nm 的延迟度，并且与热机械模拟相结合，可以访问样品中的双折射分布。（C） 2017年美国光学学会

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