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Effect of dislocation core spreading at interfaces on strength of thin-films

机译:Effect of dislocation core spreading at interfaces on strength of thin-films

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摘要

Critical strain arguments are often used to model the thickness dependence of the strength of thin films on substrates. In these arguments, plastic deformation occurs when the stress in a film is high enough that the strain energy relieved by the introduction of a misfit dislocation is sufficient to generate the line energy of that misfit. Such models typically assume compact dislocation cores. However, experimental evidence suggests that, under certain circumstances, dislocation cores may spread out into the interface between the film and the substrate. If this happens, the energy of the misfit dislocation, and the critical stress needed for its propagation, will be lowered. In this paper, the effect of dislocation core spreading on the critical stress has been modeled. The effects of interface strength, film thickness, and misfit dislocation spacing are considered.

著录项

  • 来源
    《Journal of Materials Research》 |2002年第7期|1808-1813|共6页
  • 作者单位

    Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, New York 14853;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 工程材料学;
  • 关键词

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