Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients

Yi-Jun Jen; Cheng-Lung Chiang

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Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients

机译：Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients

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摘要

We present explicit expressions for the reflection and transmission coefficients of an anisotropic thin film. In the general case, the optical axis and the incident ray are in arbitrary directions. Multireflected ordinary rays and extraordinary rays in the thin film are coupled to each other at the interface. The degrees of polarization conversion for reflected and transmitted light from the anisotropic thin film are calculated. The transmittance and reflectance are measured by rotating the polarization of the normal incident ray, and the columnar growth plane and film thickness are thus determined.

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来源
《Optical Engineering》 |2006年第2期|023802-1-023802-6-0|共6页
作者
Yi-Jun Jen; Cheng-Lung Chiang;
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作者单位

National Taipei University of Technology Department of Electro-Optical Engineering No. 1, Sec. 3, Chung-Hsiao E. Rd Taipei, Taiwan 106;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类光学仪器;
关键词
coatings; thin films; reflectance; transmittance; anistropy; birefringence;

Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients

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