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Secondary Ion Mass Spectrometry of Human Deciduous Enamel

机译:Secondary Ion Mass Spectrometry of Human Deciduous Enamel

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Secondary ion mass spectrometry was used for determining the distribution of Na, K, Mg, Sr, F and Cl in the buccal enamel of human deciduous incisors. 16 teeth were analyzed. The samples were coated, by vapour deposition, with an aluminium grid, thus making it possible to produce two-dimensional contour maps of the elements. These contour maps were used to establish the distribution of elements throughout the enamel. The metallic elements except for Sr showed increasing concentrations towards the interior of the enamel. The halogens, in contrast, had higher concentrations at the surface and decreased towards the enamel-dentin junction. Sr showed a fairly even distribution throughout the enamel. No clean-cut differences in elemental distribution were seen between post- and prenatal enamel, although the postnatal enamel exhibited relatively wide variations for some elements

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