Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

Kun-Huang Chen; Jing-Heng Chen; Jiun-You Lin

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Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

机译：Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

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摘要

We derive the phase difference equation between the p- and s-polarizations of reflection light based on the Kretschmann-Raether configuration. This phase difference equation is used to examine the relationship of the incident angle and metal film thickness versus the phase differences under a small refractive index variation. For a fixed incident angle, the phase difference has a higher measurement sensitivity than the reflectivity change. At the critical angle, there is a higher sensitivity when the metal film thickness is smaller than the skin depth. The surface plasmon resonant (SPR) angle dominates when the metal film thickness is greater than the skin depth. The phase measuring sensitivity at the SPR angle is higher than that at the critical angle by 1 order.

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来源
《Optical Engineering》 |2006年第2期|023803-1-023803-5-0|共5页
作者
Kun-Huang Chen; Jing-Heng Chen; Jiun-You Lin;
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作者单位

Feng Chia University Department of Electrical Engineering 100 Wenhwa Road, Seatwen Taichung 40724, Taiwan;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类光学仪器;
关键词
surface plasmon resonant angle; critical angle; phase difference shift; small refractive index variation;

Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

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