...
首页> 外文期刊>Review of Scientific Instruments >An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K
【24h】

An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K

机译:An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K

获取原文
获取原文并翻译 | 示例
           

摘要

The design and performance of an ultrahigh vacuum compatible cryogenic dual-tip scanning tunneling microscope is described. The microscope is attached at the bottom of a low-loss liquid helium Dewar and can be operated down to 4.2 K. The coarse positioning system consists of five linear steppers driven by piezo-tubes. The displacement of each stepper can be monitored by its own embedded capacitive position sensor with a submicron resolution, thus allowing accurate control of the tip navigation process. An alignment procedure, using a specimen made of three mutually nonparallel planes, is introduced to bring the two tips into overlapped scan ranges without the help of an additional guiding device such as an electron microscope. The overall system exhibits good mechanical rigidity and. atomic resolution has been achieved with either tip. This- instrument is well suited for investigating low temperature quantum properties of atomically clean nanostructures in a three-terminal configuration.

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号