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Unified approach to photographic methods for obtaining the angles of incidence in lowhyphen;energy electron diffraction

机译:Unified approach to photographic methods for obtaining the angles of incidence in lowhyphen;energy electron diffraction

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摘要

An equation is developed to describe the geometrical relationships between the electron gun, the crystal surface, and the phosphorescent display screen in backhyphen;reflection, posthyphen;acceleration LEED experiments. Photographic methods for determining the polar and azimuthal angles of incidence in LEED experiments can be derived starting from this equation. In particular, two published procedures appear here as special cases. New methods are described for cases where the existing techniques do not apply. It is shown that the alignment of the electron gun and the positioning of the crystal can be checked using a photographic technique. An example illustrates that the angles of incidence can be measured with precisions of plusmn;0.2deg; by recording data on several photographs taken over a wide range in electron energy.

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