AbstractSemicrystalline LaRC‐TPI is known to be capable of recrystallizing to higher melting crystalline forms upon initial melting. The behavior of these different crystalline forms has not been studied before. The present study uses techniques of differential scanning calorimetry and X‐ray diffractometry to investigate thes crystalline structural changes during recrystallization of this material. Semicrystalline LaRC‐TPIs synthesized from three different laboratories are included in this
展开▼
