A 0.5-to-2.5 Gb/s Reference-Less Half-Rate Digital CDR With Unlimited Frequency Acquisition Range and Improved Input Duty-Cycle Error Tolerance

Inti R.; Yin W.; Elshazly A.Sasidhar N.Hanumolu P.K.

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A 0.5-to-2.5 Gb/s Reference-Less Half-Rate Digital CDR With Unlimited Frequency Acquisition Range and Improved Input Duty-Cycle Error Tolerance

机译：A 0.5-to-2.5 Gb/s Reference-Less Half-Rate Digital CDR With Unlimited Frequency Acquisition Range and Improved Input Duty-Cycle Error Tolerance

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摘要

A reference-less highly digital half-rate clock and data recovery (CDR) circuit with improved tolerance to input duty cycle error is presented. Using a chain of frequency dividers, the pro posed frequency detector produces a known sub-harmonic tone from the incoming random data. A digital frequency-locked loop uses the extracted tone, and drives the oscillator to any sub-rate of the input data frequency. The early/late outputs of a conventional half-rate bang-bang phase detector are used to determine the duty-cycle error in the incoming random data and adjust the oscillator clock phases to maximize receiver timing margins. Fabricated in 0.13 μm CMOS technology, the prototype digital CDR op erates without any errors from 0.5 Gb/s to 2.5 Gb/s. At 2 Gb/s, the prototype consumes 6.1 mW power from a 1.2 V supply. The pro posed clock-phase calibration is capable of correcting upto ±20 of input data duty-cycle error.

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来源
《IEEE Journal of Solid-State Circuits》 |2011年第12期|3150-3162|共13页
作者
Inti R.; Yin W.; Elshazly A.Sasidhar N.Hanumolu P.K.;
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作者单位

Dept. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
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关键词
Digital CDR; clock phase calibration; data duty cycle error; linear delay cell; optimal sampling; power spectral density of random NRZ data; reference-less frequency acquisition;

A 0.5-to-2.5 Gb/s Reference-Less Half-Rate Digital CDR With Unlimited Frequency Acquisition Range and Improved Input Duty-Cycle Error Tolerance

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