The effect of X-ray refraction provides unconventional small angleX-ray scattering techniques which have been applied to meet actualdemands for improved nondestructive characterization of advanced highperformance ceramics. The method is based on refraction of X- rayscaused by interfaces of microstructures in heterogeneous materials.X-ray refraction reveals the inner surface concentrations of porousmaterials within the range of μm- to nm-dimensions. This techniqueis compared to mercury pressure porosimetry which is a standardmethod for pore size determination in porous solids. Silicon carbideceramics are investigated by both methods over a large range ofporosity.
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