The microstructural nonuniformity of SiC ceramics greatly affectsthe electrical characteristics. In this study, we investigated theinfluence of the microstructural nonuniformity on the electricalproperties especially when the device size was reduced. It wasrevealed that the size reduction of SiC thermistor tends to increasethe variation of the electrical properties. This phenomenon can beexplained by the percolation theory. The percolation probability alsohas a possibility to be used for a quality control in a production ofdevices.
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