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>In-situ high temperature study of ceramics and ceramic ultra-thin films using a x-ray diffractometer with a parabolic multilayer mirror
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In-situ high temperature study of ceramics and ceramic ultra-thin films using a x-ray diffractometer with a parabolic multilayer mirror
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机译：In-situ high temperature study of ceramics and ceramic ultra-thin films using a x-ray diffractometer with a parabolic multilayer mirror
In this paper, recent progress made in the field ofhigh-temperature x-ray diffraction (HT-XRD) is presented. Asubstantial part of this progress is due to the introduction of amultilayer x-ray mirror in the x-ray optical system. The parabolicshape of the mirror layers transforms the initially divergent x-raybeam into a parallel x-ray beam without a significant loss ofintensity. The diffraction angles of the parallel beam areinsensitive to changes of the sample surface position, which occure.g. due to thermal expansion of the sample or its support duringin-situ high temperature tests.
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