Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

Hong Wei; Eion Johnston; T.David Binnie

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Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

机译：Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

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摘要

This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained by deriving the modulation transfer function (MTF) from the measured contrast transfer function (CTF). Basic signal-processing techniques are used to establish a relationship between the MTF and the CTF. Experimental methodology is discussed with respect to avoidance of shift variation in the CTF. Discrete Fourier transformation is applied for a power-spectrum analysis of the MTF. Using the CTF as a measure of performance, a series of experiments were carried out to characterize an imaging system based on an integrated CMOS camera. The experimental results showed that this approach can be applied in general, for the assessment of spatial resolution for digital imaging systems. #1998 Society of Photo-Optical Instrumentation Engineers. S0091-3286(98)00609-6 Subject terms: CTF; MTF; image resolution; CMOS camera; digital imaging system; spatial frequency response. Paper 10117 received Nov. 17, 1997; revised manuscript received Apr. 14, 1998; accepted for publication Apr. 15, 1998.

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《Optical Engineering》 |1998年第9期|2565-2573|共9页
作者
Hong Wei; Eion Johnston; T.David Binnie;
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Napier University Department of Electronic and Electrical Engineering/ 219 Colinton Road Edinburgh, Scotland EH 14 1 DJ United Kingdom mail: h.wei@ napier.ac.uk;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类光学仪器;
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Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

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