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首页> 外文期刊>Optical Engineering >Observation and discrimination of the mode Patterns in a micron-sized hollow optical fiber and its synthetic measurements: far-field micro-imaging technique
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Observation and discrimination of the mode Patterns in a micron-sized hollow optical fiber and its synthetic measurements: far-field micro-imaging technique

机译:Observation and discrimination of the mode Patterns in a micron-sized hollow optical fiber and its synthetic measurements: far-field micro-imaging technique

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摘要

We report a far-field micro-imaging technique that is used for the observation and discrimination of the mode patterns in a micron-sized hollow optical fiber as well as for the synthetic measurement of the fiber. By using an M-20× microscope objective lens, we obtained images, magnified by a factor of about 460, from the mode patterns at an output end facet of the hollow fiber with relative measurement accuracy better than 3. This method can be used for clear identification of the mode patterns in the hollow fiber and detailed study of the relationship between the excitation conditions and the excited modes in the hollow fiber. Moreover, it is useful for the measurement of the geometrical sizes of the hollow fiber and for testing the coupling efficiencies of the core and cladding modes in their mixed mode pattern. In addition, this method can be also used in the generation of a dark hollow laser beam with l0-μm dark-spot size and the measurement of the focused-spot size of a Gaussian laser beam with about 1-μm diameter. # 1998 Society of Photo-Optical Instrumentation Engineers. S0091-3286(98)02808-6 Subject terms: hollow optical fiber; far-field micro-imaging; mode observation; mode discrimination; fiber test. Paper 24097 received Sep. 19, 1997; revised manuscript received Feb. 26, 1998; accepted for publication Feb. 27, 1998.

著录项

  • 来源
    《Optical Engineering》 |1998年第9期|2277-2283|共7页
  • 作者单位

    Seoul National University Department of Physics/ Seoul 151-742 Korea;

    Seoul National University Department of Physics/ 151-742 Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 光学仪器;
  • 关键词

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