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Wavefront analysis with high-accuracy inversion interferometer

机译:Wavefront analysis with high-accuracy inversion interferometer

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摘要

A recently introduced wavefront analyzer, based on a Fresnel-lens array, is improved by incorporating phase-shifting procedures The resulting compact and stable interferometer can measure wavefront distortions with extremely high accuracy. In our experiments, with no special efforts at environmental isolation, the instrumental noise level was under 0.02λ. #1997 Society of Photo-Optical Instrumentation Engineers. S0091-3286(97)01806-0

著录项

  • 来源
    《Optical Engineering》 |1997年第6期|1754-1759|共6页
  • 作者单位

    Technion-lsrael Institute of Technology/ Electrical Engineering Department Haifa 32000, Israel E-mail:jsh@ee.technion.ac.il;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 光学仪器;
  • 关键词

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