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>Note: Detection of micro-cracks in the interlayer dielectric film by the stress based light scattering method
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Note: Detection of micro-cracks in the interlayer dielectric film by the stress based light scattering method
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机译：Note: Detection of micro-cracks in the interlayer dielectric film by the stress based light scattering method
A phenomenon was discovered wherein light scattering strength from cracks increases when tensile stress is applied to micro-cracks produced in the interlayer dielectric film by chemical mechanical polishing treatment. It is likely that the change in light scattering intensity occurs because a region of high stress concentration (region with high variation in index of refraction) is produced near the crack tip due to stress, thus forming a type of scatterer. With this method, it is possible to detect only scatterers which respond to stress, and thus, it is possible to classify and separately detect cracks and particles.
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