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Quantitative surface normal measurement by a wavefront camera

机译：通过波前相机进行定量表面法线测量

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摘要

A compact wavefront camera that allows users to quantitatively measure the intensity and wavefront at a remote object plane is reported. The camera is built from a chip-scale wavefront sensor that we previously developed. By measuring the wavefront of the image and calibrating the wavefront relationship between the image and object planes, the wavefront at the object plane can be computed and the surface normal of the object can be derived. We built a prototype camera and calibrated the wavefront relationship. In a proof-of-concept experiment, a set of concave mirrors with different focal lengths (50-200 mm), were imaged. The results agree well with their expected values. To demonstrate the application of the camera, we applied this method to measure the deformation of a microfluidic channel under pressure.
机译：报告了一种紧凑的波前相机，允许用户定量测量远程物体平面的强度和波前。该相机由我们之前开发的芯片级波前传感器构建而成。通过测量图像的波前并校准图像与物体平面之间的波前关系，可以计算出物体平面处的波前，并推导出物体的表面法线。我们建造了一个原型相机，并校准了波前关系。在概念验证实验中，对一组具有不同焦距（50-200 mm）的凹面镜进行了成像。结果与预期值非常吻合。为了演示相机的应用，我们应用这种方法来测量微流体通道在压力下的变形。

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  • 来源
    《Optics Letters》 |2012年第2期|199-201|共3页
  • 作者

    Jian Ren; Xiquan Cui; Lap Man LeeChanghuei Yang;

  • 作者单位

    Department of Electrical Engineering, California Institute of Technology, 1200 East California Boulevard, Pasadena, California 91125, USA;

    Department of Bioengineering, California Institute of Technology, 1200 East California Boulevard, Pasadena, California 91125, USA;

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  • 正文语种 英语
  • 中图分类 计量学;
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