Generalized xhyphen;ray scattering factors have been determined from the evaluation of Fourier transforms of atomichyphen;orbital products. Selfhyphen;consistenthyphen;field atomic orbitals for firsthyphen;row atoms have been studied. Analytical scattering expressions for rapid evaluation on digital computers have been developed. Scattering factors from small GTO expansions have been compared with both Clementi and Huzinaga SCF atomic orbitals. For onehyphen;center orbital products, the threehyphen;set GTO atomic orbitals agree with full SCF scattering factors to within five parts per hundred or better; the fourhyphen;set GTO expansions have relative differences of 1.5percnt; or less. For the twohyphen;center scattering cases, three or more Gaussians per atomic orbital yield relative errors less than 1percnt;. The generalized xhyphen;ray scattering factors can serve as basis functions in the analysis of charge densities from xhyphen;ray diffraction data.
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