Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate

Richared Vollmerhausen; Ronald G.Driggers; Curtis Webb

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Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate

机译：Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate

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It is a well-known phenomenon that three- and four-bar patterns can sometimes be resolved with staring sensors even when the bar pattern frequency is beyond the half sample rate of the sensor. When performing a minimum resolvable temperature (MRT) test, for example, the modulation of the target bars can be significant even when the fundamental frequency of the four-bar target is higher than the half sample rate of the sensor. We show that the modulation of a four-bar target goes to zero at 0.6 times the sample rate of the sensor (1.2 times the half sample rate) if the sample phasing is optimized. If the bar pattern contains a larger number of bars, the modulation cutoff approaches the half sample rate of the sensor. Further, we illustrate that, when the sample phase is optimized during the MRT measurement, the MRT performance of a sampled imager can exceed the measured MRT performance of an analog sensor with the same system and component modulation transfer functions.#1998 Society of Photo-Optical Instrumentation Engineers.S0O91-3286(98)01506-2 Subject terms: minimum resolvable temperature difference; sampled imaging system. Paper 27117 received Nov. 29, 1997; revised manuscript received Jan. 16, 1998; accepted for publication Jan. 17, 1998.

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《Optical Engineering》 |1998年第6期|1763-1769|共7页
作者
Richared Vollmerhausen; Ronald G.Driggers; Curtis Webb;
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作者单位

U.S.Army Communications and Electronics Command Night Vision and Electronic Sensors Directorate / Ft.Belvoir,Virginia 22060-5677 E-mail:rvollmer@ nvl.army.mil;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
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正文语种英语
中图分类光学仪器;
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Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate

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