...
首页> 外文期刊>review of scientific instruments >The Oxford electronhyphen;beam ion trap: A device for spectroscopy of highly charged ions
【24h】

The Oxford electronhyphen;beam ion trap: A device for spectroscopy of highly charged ions

机译:The Oxford electronhyphen;beam ion trap: A device for spectroscopy of highly charged ions

获取原文
           

摘要

An electronhyphen;beam ion trap (EBIT) has just been completed in the Clarendon Laboratory, Oxford. The design is similar to the devices installed at the Lawrence Livermore National Laboratory. It is intended that the Oxford EBIT will be used for xhyphen;ray and UV spectroscopy of hydrogenic and heliumhyphen;like ions, laser resonance spectroscopy of hydrogenic ions and measurements of dielectronic recombination cross sections, in order to test current understanding of simple highly charged ions.
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号