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首页> 外文期刊>Key engineering materials >Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence
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Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence

机译：Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence

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摘要

The electro-stimulated luminescence spectrum of a rare-earth ion added to zirconia (ZrO_2) lattice was investigated with the aim of using it as a sensor for nano-scale stress (fluorescence piezo-spectroscopy) and phase transformation assessments in a field emission scanning electron microscope (FE-SEM). In this paper, the selected rare-earth fluorescent ion Eu, added to ZrO_2 as a raw oxide powder (Eu_2O_3) before sintering (in the amount of 1.0 wt. ). Spectroscopic results indicated that the spectral shift of some fluorescent band of the selected rare-earth ion was sensitive to residual stress and that the electron-stimulated spectra of Eu_2O_3-doped ZrO_2 in its tetragonal and monoclinic polymorphs were different to each other. Based on these findings, the luminescent substance can be useful as a "stress and phase transformation sensor", in order to clarify the elementary mechanisms behind synthetic ZrO_2.

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