Toward superfast three-dimensional optical metrology with digital micromirror device platforms

Bell Tyler; Zhang Song

首页> 外文期刊>Optical Engineering >Toward superfast three-dimensional optical metrology with digital micromirror device platforms

【24h】

Toward superfast three-dimensional optical metrology with digital micromirror device platforms

机译：Toward superfast three-dimensional optical metrology with digital micromirror device platforms

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相关主题

摘要

Decade-long research efforts toward superfast three-dimensional (3-D) shape measurement leveraging the digital micromirror device (DMD) platforms are summarized. Specifically, we will present the following technologies: (1) high-resolution real-time 3-D shape measurement technology that achieves 30 Hz simultaneous 3-D shape acquisition, reconstruction, and display with more than 300,000 points per frame; (2) superfast 3-D optical metrology technology that achieves 3-D measurement at a rate of tens of kilohertz utilizing the binary defocusing method we invented; and (3) the improvement of the binary defocusing technology for superfast and high-accuracy 3-D optical metrology using the DMD platforms. Both principles and experimental results are presented. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)

著录项

来源
《Optical Engineering》 |2014年第11期|112206-1-112206-9|共9页
作者
Bell Tyler; Zhang Song;
展开▼
作者单位

Iowa State Univ, Dept Mech Engn, Ames, IA 50011 USA;

展开▼
收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类计量学;光学仪器;
关键词
superfast three-dimensional optical metrology; binary defocusing; phase shifting; fringe analysis; structured light;

Toward superfast three-dimensional optical metrology with digital micromirror device platforms

摘要

著录项

相关主题

期刊订阅