Binary fractal image quantification using probe coherent beam scanning

Dmitry A. Zimnyakov

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Binary fractal image quantification using probe coherent beam scanning

机译：Binary fractal image quantification using probe coherent beam scanning

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Some possibilities for binary 2-D fractal image characterization using correlation analysis of the transmitted light intensity fluctuations are discussed. These intensity fluctuations are produced by the probe coherent beam scanning of the studied object. Two different cases of diagnostics of the mass fractal structures are considered: with a broad collimated illuminating beam and with a sharply focused beam. Relationships between generalized characteristics of the studied structures (e.g., Hausdorff dimension) and asymptotic parameters of the structure functions of the intensity fluctuations (e.g., their exponents) are analyzed. Experimental results obtained with the specially prepared 2-D mass fractal structures (binary amplitude screens) are presented. Possible applications for morphological analysis of tissue structures are discussed. # 1997 Society of Photo-Optical Instrumentation Engineers. S0091-3286(97)01605-X Subject terms: diffraction; mass fractal; intensity fluctuations; structure function; Hausdorff dimension. Paper 12076 received July 11, 1996; revised manuscript received Jan. 6, 19{)7; accepted for publication Jan. 6, 1997.

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《Optical Engineering》 |1997年第6期|1443-1451|共9页
作者
Dmitry A. Zimnyakov;
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Saratov State University Optics Department 83 Astrakhanskaya 410026 Saratov, Russia and Russian Academy of Sciences Precision Mechanics and Control Institute Laboratory of Laser and Optoelectronic Measuring Systems 24 Rabochaya 410028 Saratov, Russia;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
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正文语种英语
中图分类光学仪器;
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Binary fractal image quantification using probe coherent beam scanning

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