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首页> 外文期刊>Review of Scientific Instruments >A novel method to characterize photorefractive damage in quasiphase-matched wavelength converters
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A novel method to characterize photorefractive damage in quasiphase-matched wavelength converters

机译:A novel method to characterize photorefractive damage in quasiphase-matched wavelength converters

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摘要

A novel two-beam method is proposed and applied for the first time, to characterize photorefractive damage (PRI)) in a LiNbO{sub}3 quasiphase-matched (QPM) wavelength converter In the proposed method, irradiation light from a Ti sapphire laser and a broadband probe beam from an erbium-doped fiber amplifier are coupled into a LiNbO{sub}3 QPM waveguide. The PRD effect caused by the irradiation is studied by monitoring the generated second-harmonic light spectrum of the probe light It is shown that PRD in the LiNbO{sub}3 QPM waveguide can be qualitatively characterized by the proposed method, and relevant information relating to the QPM wavelength conversion can be extracted directly.

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