We present a method for nanoscale simultaneous measurements of the conductivity and morphology of microfluidic systems. While device morphology is imaged by atomic force microscopy (AFM), the AFM tip is used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. Connectivity to a reference electrode can be probed simultaneously at a large number of test points along micro- and nanofluidic channels without the requirement of external fluidic connections. Since the placement of microelectrodes is essential to a number of microfluidic applications, this technique allows for the AFM tip to be used as a rapid prototyping tool. (C) 2003 American Institute of Physics. References: 9
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