Pressures in excess of 1.4 Mbars have been attained by Ruoff and Wanagel1by pressing tiny spherical diamond indentors (tip radius of 2 mgr;m or less) against a diamond anvil. This system has been used for resistancehyphen;vshyphen;pressure measurements as follows. A thin (200 Aring;) coherent layer of a conductor, e.g., palladium, can be sputtered on the tip and on the anvil and electrical leads can then be attached to these at points remote from the contact area. Then a thin layer of the sample to be studied can be evaporated, sputtered, or placed on the anvil. When the indentor is pressed against the sample, the resistance changes as the pressure increases and as the contact radius increases. This paper analyzes the resistancehyphen;vshyphen;pressure relationship for three different types of resistivityhyphen;vshyphen;pressure behavior.
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