Transient x-ray diffraction used to diagnose shock compressed Hi crystals on the Nova laser

D. H. Kalantar; E. A. Chandler; J. D. ColvinR. LeeB. A. RemingtonS. V. WeberL. G. WileyA. HauerJ. S. WarkA. LoveridgeB. H. FailorM. A. MeyersG. Ravichandran

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Transient x-ray diffraction used to diagnose shock compressed Hi crystals on the Nova laser

机译：Transient x-ray diffraction used to diagnose shock compressed Hi crystals on the Nova laser

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Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Hi crystal, as well as from Hi at an embedded ablator/Hi interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Example of the data and post-processed simulations are presented.

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《Review of Scientific Instruments》 |1999年第2期|629-632|共4页
作者
D. H. Kalantar; E. A. Chandler; J. D. ColvinR. LeeB. A. RemingtonS. V. WeberL. G. WileyA. HauerJ. S. WarkA. LoveridgeB. H. FailorM. A. MeyersG. Ravichandran;
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Lawarence Livermore National Laboratory, Livermore, California 94550;

Los Alamos National Laboratory, Los ALamos, New Mexico 87545;

Department of Physics, Clarendon Laboratory, University of Oxford, Oxford OX1 3PU, United KingdomPhysics International, San Leandro, California 94577University of California at San Diego, La Jolla, California 92093California Institute of Technology, Pasadena, California 91125;

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Transient x-ray diffraction used to diagnose shock compressed Hi crystals on the Nova laser

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