A novel method of estimating the remaining thickness of a defective plate having the form of localized thinning using digital shearography, based on a simple relationship between the curvature of the deflected defect and the defect geometry is presented. # 1999 society of Photo-Optical Instrumentation Engineers. S0091-3286(99)01709-2 Subject terms: digital shearography; defect detection; nondestructive testing; speckle metrology; interferometry. Paper 980199 received May 20, 1998; revised manuscript received Oct. 26, 1998; accepted for publication Apr. 12, 1999.
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