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Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperature
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机译：Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperature
A bench top instrument has been constructed which allows for the measurements of radiance, directionalhyphen;hemispherical reflection, and directionalhyphen;hemispherical transmission from materials at elevated temperatures from 100 to over 2000thinsp;deg;C. The instrument measures these radiative properties over a wide spectral range, in the nearhyphen; and midhyphen;IR, from 12thinsp;500 to 500 cmminus;1(0.8ndash;20 mgr;m). These measurements are then processed to determine the spectral emittance of the material and the temperature at the point of measurement. The instrument has applications for (1) industrial quality control of radiative properties of processed materials; (2) research and development of new materials; (3) temperature measurement by optical techniques in the nearhyphen; and midhyphen;IR; and (4) determination of heat transfer properties of materials. This article describes the instrument and its novel components, and presents measurement results for several materials.
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