Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

Cockinsa L.; Miyahara Y.; Bennett S.D.Clerk A.A.Studenikin S.Poole P.Sachrajda A.Grutter P.

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Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

机译：Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

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Strong confinement of charges in few-electron systems such as in atoms, molecules, and quantum dots leads to a spectrum of discrete energy levels often shared by several degenerate states. Because the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important.We show how electrostatic force detection using atomic force microscopy reveals the electronic structure of individual and coupled self-assembled quantum dots. An electron addition spectrum results from a change in cantilever resonance frequency and dissipation when an electron tunnels on/off a dot. The spectra show clear level degeneracies in isolated quantum dots, supported by the quantitative measurement of predicted temperature-dependent shifts of Coulomb blockade peaks. Scanning the surface shows that several quantum dots may reside on what topographically appears to be just one. Relative coupling strengths can be estimated from these images of grouped coupled dots.

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《Proceedings of the National Academy of Sciences of the United States of America》 |2010年第21期|9496-9501|共6页
作者
Cockinsa L.; Miyahara Y.; Bennett S.D.Clerk A.A.Studenikin S.Poole P.Sachrajda A.Grutter P.;
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作者单位

Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A 2T8, Canada;

Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, ON K1A 0R6, Canada;

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收录信息美国《科学引文索引》(SCI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
原文格式 PDF
正文语种英语
中图分类自然科学总论;
关键词
Electrostatic force microscopy; Nanoelectronics; Shell structure; Single-electron charging;

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

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