Modified Shewhart charts for high yield processes

Tee Chin Chang; Fah Fatt Can

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Modified Shewhart charts for high yield processes

机译：用于高产量工艺的改进型 Shewhart 图表

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摘要

It is discussed that, in manufacturing industries, though the Shewhart p and np charts are the most commonly used scheme for monitoring fraction nonconforming p, these charts are found to be not effective for monitoring high yield processes. Therefore, it is attempted to propose an improved Shewhart np chart that is sensitive to either increase or decrease in p. Instead of dealing with control limits, the proposed np chart considers runs rules to determine the status of high yield processes. The performance of the proposed modified Shewhart chart is compared with those of the charts available in the literature for use in monitoring high yield processes. An example is also given for illustration.

机译：本文讨论指出，在制造业中，尽管休哈特 p 和 np 图是监测分数不合格 p 的最常用方案，但这些图表被发现对监测高产量过程无效。因此，试图提出一种改进的 Shewhart np 图，该图对 p 的增加或减少都敏感。所提出的 np 图没有处理控制限制，而是考虑了运行规则来确定高产量过程的状态。将所提出的修改后的休哈特控制图的性能与文献中用于监测高产过程的控制图的性能进行了比较。还举了一个例子来说明。

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来源
《Quality Control and Applied Statistics》 |2008年第6期|545-546|共2页
作者
Tee Chin Chang; Fah Fatt Can;
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作者单位

GlaxoSmithKline, Singapore;

National University of Singapore;

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原文格式 PDF
正文语种英语
中图分类概率论、数理统计的应用;
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Modified Shewhart charts for high yield processes

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