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Geometrically desensitized interferometry for shape measurement of flat surfaces and 3-D structures

机译:几何脱敏干涉测量法,用于平面和三维结构的形状测量

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We construct an interferometer for flatness testing of precision-engineered objects such as rigid disk drive platters, pump parts, and fuel injectors. A pair of phase diffraction gratings illuminate an object simultaneously at two different angles of incidence, resulting in an equivalent wavelength of 12.5 mu m. This system operates in standard phase-shifting mode for a height resolution of 0.01 mu m with up to 150 mu m of surface departure. The <1 s measurement speed, 96-mm viewing aperture, simple mechanical part alignment, and 50-mm working distance are consistent with high-volume production testing, A recently developed coherence scanning mode accommodates even larger departures and discontinuous regions such as step heights, (C) 2000 Society of Photo-Optical Instrumentation Engineers. S0091-3286(00)01001-1. References: 15
机译:我们构建了一个干涉仪,用于对精密设计的物体进行平面度测试,例如刚性盘片、泵部件和喷油器。一对相位衍射光栅以两个不同的入射角同时照亮物体,产生 12.5 μ m 的等效波长。该系统在标准移相模式下运行,高度分辨率为 0.01 μ m,表面偏离高达 150 μm。<1 秒的测量速度、96 毫米的观察孔径、简单的机械零件对准和 50 毫米的工作距离与大批量生产测试一致,最近开发的相干扫描模式可以适应更大的偏离和不连续区域,例如台阶高度, (C) 2000 年光电仪器工程师协会。[S0091-3286(00):01001-1].[参考文献: 15]

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