Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently,with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty andgood circuits has become a problem. Analog blocks embedded in digital systems may not easily beseparately testable. Consequently, many papers have been recently written proposing techniques toreduce the burden of testing analog and mixed-signal circuits. This survey attempts to outline some ofthis recent work, ranging from tools for simulation-based test set development and optimization tobuilt-in self-test (BIST) circuitry.
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