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机译:
[Schulz, WM;
Rossbach, R;
Reischle, MBeirne, GJBommer, MJetter, MMichler, P] Univ Stuttgart, Inst Halbleiteropt & Funktionelle Grenzflachen, D-70569 Stuttgart, Germany;
aluminium compounds; atomic force microscopy; gallium compounds; III-V semiconductors; indium compounds; photoluminescence; semiconductor quantum dots; spectral line intensity; SINGLE-PHOTON EMISSION; TEMPERATURE-DEPENDENCE; DIELECTRIC FUNCTION; GROWTH; ISLANDS; SPECTROSCOPY; RELAXATION; DYNAMICS; LASERS; ENERGY;