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首页> 外文期刊>Materials Letters >A technique for determination of gamma/gamma interface relationships in a (alpha_2 + gamma) TiAl base alloy using TEM Kikuchi patterns
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A technique for determination of gamma/gamma interface relationships in a (alpha_2 + gamma) TiAl base alloy using TEM Kikuchi patterns

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摘要

A new method for unambiguous differentiation and orientation determination of six gamma variants and alpha_2 phase in a two phase TiAl base alloy is presented. The approach involves automatic collection of transmission electron microscopy (TEM) Kikuchi patterns by a digital CCD camera at regular distance of nano steps through nanoprobe scanning. The Kikuchi patterns corresponding to various y variants and alpha_2 phase were distinguished through superlattice bands. The procedure is compared with other methods for identification of six y variants and alpha_2 phase in terms of their spatial and angular resolutions as well as easiness and rapidity for large data collection. As an example, the technique is utilised to characterise the lamellar structures of a Ti-48(at. percent)Al-2Cr-2Nb alloy resulting from heat treatment at high temperature alpha domain followed by furnace cooling. Each lamella is labelled with its respective y variant or alpah_2 phase. The frequencies of the gamma and gamma/gamma interfaces were determined. Moreover, it is noticed that some of the 0 deg and 180 deg gamma/gamma interfaces are in fact semi-coherent, and present a slight deviation from their ideal misorientation.

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