Publisher's Note: Charge transfer in silicon clathrates studied by Compton scattering Phys. Rev. B 76, 233104 (2007)

M. Volmer; C. Sternemann; J. S. TseT. BuslapsN. HiraokaC. L. BullJ. GrykoP. F. McMillanM. PaulusM. Tolan

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Publisher's Note: Charge transfer in silicon clathrates studied by Compton scattering Phys. Rev. B 76, 233104 (2007)

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This paper was published online on 21 December 2007 with a typographical error in the first affiliation in the author list. The first affiliation should read as "Fakultaet Physik/DELTA,...". The affiliation has been corrected as of 17 January 2008. The affiliation is incorrect in the printed version of the journal.

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《Physical review, B. Condensed matter and materials physics》 |2008年第3期|039902.1-039902.1|共1页
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M. Volmer; C. Sternemann; J. S. TseT. BuslapsN. HiraokaC. L. BullJ. GrykoP. F. McMillanM. PaulusM. Tolan;
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中图分类固体物理学;
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X-ray scattering; molecular sieves; zeolites; clathrates; and other complex solids; density functional theory; local density approximation; gradient and other corrections; publisher's note;

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1. Publisher's Note: Charge transfer in silicon clathrates studied by Compton scattering [Phys. Rev. B 76, 233104 (2007)] [J] . M. Volmer, C. Sternemann, J. S. Tse, Physical review. B, Condensed Matter And Materials Physics . 2008,第3期

机译：出版商注：硅酸盐包合物中的电荷转移通过康普顿散射研究[物理化学。 Rev. B 76，233104（2007）]
2. Publisher’s Note: “On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects” J. Appl. Phys. 133, 014101 (2023) [J] . Bouregba Rachid Journal of Applied Physics . 2023,第3期

机译：Publisher’s Note: “On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects” J. Appl. Phys. 133, 014101 (2023)

Publisher's Note: Charge transfer in silicon clathrates studied by Compton scattering Phys. Rev. B 76, 233104 (2007)

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