A ±36-A Integrated Current-Sensing System With a 0.3 Gain Error and a 400- μA Offset From ?55 °C to +85 °C

Saleh Heidary Shalmany; Dieter Draxelmayr; Kofi A. A. Makinwa

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A ±36-A Integrated Current-Sensing System With a 0.3 Gain Error and a 400- μA Offset From ?55 °C to +85 °C

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摘要

This paper presents an integrated shunt-based current-sensing system (CSS) capable of handling ±36-A currents, the highest ever reported. It also achieves a 0.3 gain error and a 400-μA offset, which is significantly better than the state-of-the-art systems. The heart of the system is a robust 260-μΩ shunt resistor made from the lead frame of a standard HVQFN plastic package. The resulting voltage drop is then digitized by a precision ΔΣ ADC and a bandgap reference (BGR). At the expense of current handling capability, a ±5-A version of the CSS uses a 10-mQ on-chip metal shunt to achieve just a 4-μA offset. Both designs are realized in a standard 0.13-μm CMOS process and draw 13 μA from a 1.5-V supply. Compensation of the spread and nonlinear temperature dependency of the shunt resistor Rshunt is accomplished by the use of a fixed polynomial master curve and a single room temperature calibration. This procedure also effectively compensates for the residual spread and nonlinearity of the ADC and the BGR.

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来源
《IEEE Journal of Solid-State Circuits》 |2017年第4期|1034-1043|共10页
作者
Saleh Heidary Shalmany; Dieter Draxelmayr; Kofi A. A. Makinwa;
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作者单位

Department of Micro-Electronics, Delft University of Technology, Delft, The Netherlands;

Infineon Technologies AG, Villach, Austria;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类基本电子电路;
关键词
Temperature measurement; Lead; Temperature sensors; Calibration; System-on-chip; Resistors;

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A ±36-A Integrated Current-Sensing System With a 0.3 Gain Error and a 400- μA Offset From ?55 °C to +85 °C

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