We present evidence that subsurface carbon nanoparticles in Bi2Sr2CaCu2O8+delta can be manipulated with nanometer precision using a scanning tunneling microscope. High-resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.
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