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首页> 外文期刊>Review of Scientific Instruments >Measurement of XeI and XeII velocity in the near exit plane of a low-power Hall effect thruster by light induced fluorescence spectroscopy
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Measurement of XeI and XeII velocity in the near exit plane of a low-power Hall effect thruster by light induced fluorescence spectroscopy

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摘要

Near exit plane non-resonant light induced fluorescence spectroscopy is performed in a Hall effect low-power Xenon thruster at discharge voltage of 250 V and anode flow rate of 0.7 mg/s. Measurements of the axial and radial velocity components are performed, exciting the 6s~23/2_2~0 → 6p~23/2_2 transition at 823.16 nm in XeI and the 5d4_(7/2) → 6p3_(5/2)~0 transition at 834.724 nm in XeII. No significant deviation from the thermal velocity is observed for XeI. Two most probable ion velocities are registered at a given position with respect to the thruster axis, which are mainly attributed to different areas of creation of ions inside the acceleration channel. The spatial resolution of the set-up is limited by the laser beam size (radius of the order of 0.5 mm) and the fluorescence collection optics, which have a view spot diameter of 8 mm.

著录项

  • 来源
    《Review of Scientific Instruments》 |2013年第6期|065113-1-065113-6|共6页
  • 作者单位

    CNISM, University of Siena, CSC and DSFTA, via Roma 56, 53100 Siena, Italy;

    CNISM, University of Siena, CSC and DIISM, via Roma 56, 53100 Siena, Italy;

    Aerospazio Tecnologie Srl., via Provinciale Nord 42a, 53040 Rapolano Terme (SI), Italy;

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  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 仪器、仪表;
  • 关键词

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