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首页> 外文期刊>Solid-State Electronics >Wavefunction scarring and classical commensurability in corrugated quantum wires
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Wavefunction scarring and classical commensurability in corrugated quantum wires

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摘要

The low temperature magneto-resistance of quasi-ballistic, corrugated quantum wires has been studied. In the region near zero magnetic field, the magneto-resistance exhibits a series of clear oscillations which simulations reveal to be associatedwith multiple backscattering of electrons from the intentionally induced gate corrugation. This backscattering, in turn, gives rise to a strong scarring of the probability density in the wire, the details of which are easily related to classicalscattering trajectories within it.

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