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首页> 外文期刊>精密工学会誌 >A New Isotropic Dry Etching Using CIF_3 Gas for Si Micromachining
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A New Isotropic Dry Etching Using CIF_3 Gas for Si Micromachining

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摘要

Within the micromachining field, which is based on semiconductor manufacturing technology, wet etching and plasma etching are generally used as the isotropic etching for producing movable parts on silicon wafer. However, these methods have the following disadvantages. 1) Wet etching; ①Dynamic damage such as surface tension occurs, ②It is difficult to perform in-line etching, 2) Plasma etching; ①Thermal damage due to plasma, ②Detoxication at high-temperature is required. To solve them, it is proposed a new isotropic dry etching using ClF_3 gas. The following results e obtained experimentally; (1) Si can be etched isotropically by CIF_3 gas at room temperature and atmospheric pressure, (2) Ni film electroplated and Cr film sputtered e useful as makes for CIF_3 gas dry etching, (3) Ni rotor electroplated on Si could be released by the proposed CIF_3 gas etching.

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