Physical-chemistry of 'polygomer' surfaces through AFM force measurements

C. Devaux; J.-P. Chapel

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Physical-chemistry of 'polygomer' surfaces through AFM force measurements

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摘要

AFM microscope is used here as a surface forces apparatus at the nanometer scale. We show through several examples that the curves forces (nN) vs. distance (nm) obtained are the physico-chemical signature of the interacting surfaces. From such a curve, chemical, frictional (mobility) and mechanical top surface aspects can be studied.

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《Revue de Metallurgie: Cahiers d'Informations Techniques》 |2003年第5期|541-549|共9页
作者
C. Devaux; J.-P. Chapel;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng;;fre
中图分类冶金工业;
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Physical-chemistry of 'polygomer' surfaces through AFM force measurements

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