Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy

Pranav Agarwal; Tathagata De; Murti V. Salapaka

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Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy

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In this article, a switching gain proportional-integral-differential controller is used to reduce probe-loss affected regions in an image, obtained during tapping mode operation. Switching signal is derived from the "reliability index" signal, which demarcates regions where the tip has lost contact with the sample (probe-loss), within couple of cantilever oscillation cycles, thereby facilitating use of higher than optimal controller gain without deteriorating on-sample performance. Efficacy of the approach is demonstrated by imaging calibration sample at tip velocity close to 240 (mu)m/s and plasmid DNA at tip velocity of 60 (mu)m/s indicating significant reduction of probe-loss areas and recovery of lost sample features.

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来源
《Review of Scientific Instruments》 |2009年第10期|103701-1-103701-5|共5页
作者
Pranav Agarwal; Tathagata De; Murti V. Salapaka;
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作者单位

Department of Electrical and Computer Engineering, NanoDynamics Systems Laboratory, University of Minnesota-Twin Cities, Minneapolis, Minnesota 55455, USA;

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原文格式 PDF
正文语种英语
中图分类仪器、仪表;
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Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy

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