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首页> 外文期刊>Journal of Applied Physics >Structural, microstructural, and transport properties of highly oriented LaNiO_(3) thin films deposited on SrTiO_(3) (100) single crystal
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Structural, microstructural, and transport properties of highly oriented LaNiO_(3) thin films deposited on SrTiO_(3) (100) single crystal

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摘要

Electrical conductive textured LaNiO_(3)/SrTiO_(3) (100) thin films were successfully produced by thepolymeric precursor method. A comparison between features of these films of LaNiO_(3) (LNO) when heat treated in a conventional furnace (CF) and in a domestic microwave (MW) oven is presented. The x-ray diffraction data indicated good crystallinity and a structural orientation along the (h00) direction for both films. The surface images obtained by atomic force microscopy revealed similar roughness values, whereas films LNO-MW present slightly smaller average grain size (approx80 nm) than those observed for LNO-CF (60-150 nm). These grain size values were in good agreement with those evaluated from the x-ray data. The transport properties have been studied by temperature dependence of the electrical resistivity rho(T) which revealed for both films a metallic behavior in the entire temperature range studied. The behavior of rho(T) was investigated, allowing to a discussion of the transport mechanisms in these films.

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