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首页> 外文期刊>Review of Scientific Instruments >Time-of-flight secondary ion mass spectrometry with transmission of energetic primary cluster ions through foil targets
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Time-of-flight secondary ion mass spectrometry with transmission of energetic primary cluster ions through foil targets

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摘要

We developed time-of-flight (TOF) secondary ion (SI) mass spectrometry that provides informative SI ion mass spectra without needing a sophisticated ion beam pulsing system. In the newly developed spectrometry, energetic large cluster ions with energies of the order of sub MeV or greater are used as primary ions. Because their impacts on the target surface produce high yields of SIs, the resulting SI mass spectra are informative. In addition, the start signals necessary for timing information on primary ion incidence are provided by the detection signals of particles emitted from the rear surface of foil targets upon transmission of the primary ions. This configuration allows us to obtain positive and negative TOF SI mass spectra without pulsing system, which requires precise control of the primary ions to give the spectra with good mass resolution. We also successfully applied the TOF SI mass spectrometry with energetic cluster ion impacts to the chemical structure characterization of organic thin film targets.

著录项

  • 来源
    《Review of Scientific Instruments》 |2014年第3期|033107-1-033107-6|共6页
  • 作者单位

    Takasaki Advanced Radiation Research Institute (TARRI), Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292, Japan;

    National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan;

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  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 仪器、仪表;
  • 关键词

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