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机译:
ASM Europe BV, Versterkerstraat 8, 1322 AP Almere, The Netherlands;
Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands;
Carbon-Biotechnology Ltd., Xiangyun Road No. 6, 203000 Wujin Jingfa district, Changzhou, Jiangsu, ChinaRoyal Institute of Technology (KTH), Electrum 229, Isafjordsgatan 22, 16440 Kista, SwedenEvonik Industries AG, Paul-Baumann-Strasse 1, 45772 Marl, GermanyChristaan van der Klaauw Astronomical Watches, Businesspark Friesland-West 47, 8447 SL Heerenveen, The NetherlandsInfinite Potential Laboratories, 485 Wes Graham Way, Ontario N2L 0A7, CanadaLeiden Probe Microscopy B. V, J.H. Oortweg 21, 2333 CH Leiden, The NetherlandsAdvanced Research Center for Nanolithography, P.O. Box 41883, 1009 DB Amsterdam, The Netherlands;
机译:Surface Characterization of Materials at Ambient Conditions by Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)
机译:Atomically resolved interlayer electronic states in complex oxides by using cross-sectional scanning tunneling microscopy
机译:Resolving complex atomic-scale spin structures by spin-polarized scanning tunneling microscopy