Progress in probe microscopy

Robert Stephenson; Mark Welland

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Progress in probe microscopy

机译：探针显微镜研究进展

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The development of scanning probe microscopies over the last 15 years has been a major success story. It has given a new lease of life to research areas that had been limited by the inability to observe features at the atomic scale, and it has even created new lines of investigation. While the technology of scanning probe microscopy (SPM) has advanced extremely rapidly, a remarkable feature of the commercial sector is that it has matched this progress by continually developing new products for SPM. This is partly due to the close alliance between manufactures and specific research groups, but also reflects the demands of SPM users for the latest development.

机译：在过去的15年中，扫描探针显微技术的发展一直是一个重大的成功案例。由于无法观察原子尺度的特征，它给研究领域带来了新的生机，甚至创造了新的研究思路。尽管扫描探针显微镜（SPM）技术发展非常迅速，但商业领域的显着特征是它通过不断开发SPM新产品来与这一进步相匹配。部分原因是制造商和特定研究小组之间的紧密联盟，但也反映了SPM用户对最新开发的需求。

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《Physics world》 |1996年第5期|共1页
作者
Robert Stephenson; Mark Welland;
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正文语种 eng
中图分类物理学;
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1. Progress in scanning probe microscopy: High resolution force microscopy and spectroscopy [J] . Erlandsson R., Apell P. Current Science: A Fortnightly Journal of Research . 2000,第12期

机译：扫描探针显微镜技术的进展：高分辨率力显微镜和光谱学
2. Recent progress of graphene orientation determination technology based on scanning probe microscopy [J] . Zhang Yu, Liu Guangjie, Xu Wenjing Micro & nano letters . 2020,第8期

机译：基于扫描探针显微镜的石墨烯取向测定技术的最新进展
3. Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy [J] . Owoong Kwon, Daehee Seol, Huimin Qiao, Advanced Science . 2020,第17期

机译：扫描探针显微镜纳米压电和铁电性能纳米级评价的最新进展
4. Progress in ultrafast scanning probe microscopy [C] . Weiss, S., Botkin, . 1994

机译：超快速扫描探针显微镜的研究进展
5. Exploring Atomic Force Microscopy To Probe Charge Transport Through Molecular Films And For The Development Of Combinatorial Force Microscopy. [D] . Chisholm, Roderick A. 2011

机译：探索原子力显微镜以探测通过分子膜的电荷传输并开发组合力显微镜。
6. Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy [O] . Owoong Kwon, Daehee Seol, Huimin Qiao, 2020

机译：扫描探针显微镜纳米压电和铁电性能纳米级评价的最新进展
7. Application and Progress in the Scanning Probe Microscopy. High Density Information Storage Using Langmuir-Blodgett Film and Atomic Force Microscopy. [O] . Kiyoshi TAKIMOTO, Ryo KURODA, Koji YANG, 1997

机译：扫描探针显微镜中的应用和进展。使用Langmuir-Blodgett薄膜和原子力显微镜的高密度信息存储。
8. Progress in ultrafast scanning probe microscopy [R] . Weiss, S., Botkin, D., Ogletree, D. F., 1994

机译：超快扫描探针显微镜的研究进展

Progress in probe microscopy

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