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首页> 外文期刊>Physica, B. Condensed Matter >High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique
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High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique

机译：非布拉格衍射材料的高分辨率X射线衍射成像，采用相检索X射线衍射（PRXRD）技术

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摘要

An X-ray diffraction technique has recently been developed and successfully applied to comprehensively, including both phase and amplitude contrast, map the complex refractive index of non-crystalline materials with submicron spatial resolution. The methodology is based on the measurement of a high angular resolution X-ray Fraunhofer diffraction pattern with further application of the phase-retrieval formalism using a logarithmic dispersion relation. The technique is reviewed from the perspective of its ability to deliver ultra-high, order of several nanometres, spatial resolution and to uniquely determine both the real and imaginary components of the complex refractive index of the material under analysis. Potential niche of practical applications is discussed in terms of the spatial resolution and field of view achievable by the method. (C) 2004 Elsevier B.V. All rights reserved.
机译：最近开发了一种X射线衍射技术，并将其成功地全面应用，包括相位和幅度对比度，以亚微米的空间分辨率绘制了非晶态材料的复折射率。该方法基于对高角度分辨率X射线Fraunhofer衍射图的测量，并进一步使用对数色散关系应用相位检索形式。从提供超高，几纳米量级，空间分辨率并唯一确定被分析材料的复折射率的实部和虚部的能力的角度出发，对该技术进行了综述。根据该方法可实现的空间分辨率和视野，讨论了实际应用中的潜在领域。 （C）2004 Elsevier B.V.保留所有权利。

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